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BS PD IEC TR 62878-2-7:2019
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BS PD IEC TR 62878-2-7:2019

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Device embedding assembly technology-Guidelines. Accelerated stress testing of passive embedded circuit boards

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BS PD IEC TR 62878-2-7:2019 describes the accelerated stress testing of passive embedded circuitboards. It can be used for screening finished boards, including multilayer and high-densityinterconnection (HDI) boards. These boards are mainly for mobile devices.

Cross References:
IEC 60194


All current amendments available at time of purchase are included with the purchase of this document.

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